Sensofar Metrology presents a new non-contact, high-performance 3D profiler microscope system specially developed for measurements in the subnano, nano and micro range. According to the manufacturer, the new S neox device is particularly impressive because of its speed. Data acquisition takes place at 180 fps. The standard data acquisition is 5 times faster than before and is particularly suitable for R&D and quality control laboratories. The sensor head of the S neox is equipped with 3-in-1 technology. The operating modes confocal, interferometry and the new Ai focus variation contribute decisively to the versatility of the system. Important features are: new focus variation with active illumination (Ai) for shape measurement of large, rough surfaces; new thin-film measurement to determine the thickness of optically transparent layers in less than one second; Differential Interference Contrast (DIC) has been added to highlight particularly small height features; High Dynamic Range (HDR) imaging reduces reflection and drop-out points on highly reflective surfaces. The S neox is supplied with an intuitive and user-friendly software interface (SensoSCAN 7) for controlling the system and with the new software (SensoView) offering a wide range of analysis functions.
Autor(en): Wi
